Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines

Wheat grain yield (GY) improvement using genomic tools is important for achieving yield breakthroughs. To dissect the genetic architecture of wheat GY potential and stress-resilience, we have designed this large-scale genome-wide association study using 100 datasets, comprising 105,000 GY observatio...

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Detalles Bibliográficos
Autores principales: Juliana, Philomin, Singh, Ravi Prakash, Poland, Jesse, Shrestha, Sandesh, Huerta-Espino, Julio, Govindan, Velu, Mondal, Suchismita, Crespo-Herrera, Leonardo Abdiel, Kumar, Uttam, Joshi, Arun Kumar, Payne, Thomas, Bhati, Pradeep Kumar, Tomar, Vipin, Consolacion, Franjel, Campos Serna, Jaime Amador
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7933281/
https://www.ncbi.nlm.nih.gov/pubmed/33664297
http://dx.doi.org/10.1038/s41598-021-84308-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7933281/
https://www.ncbi.nlm.nih.gov/pubmed/33664297
http://dx.doi.org/10.1038/s41598-021-84308-4

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