Annealing of focused ion beam damage in gold microcrystals: an in situ Bragg coherent X-ray diffraction imaging study

Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been developed to reduce FIB-induced strain; however, these prot...

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Detalles Bibliográficos
Autores principales: Yang, David, Phillips, Nicholas W., Song, Kay, Harder, Ross J., Cha, Wonsuk, Hofmann, Felix
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7941296/
https://www.ncbi.nlm.nih.gov/pubmed/33650568
http://dx.doi.org/10.1107/S1600577520016264

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7941296/
https://www.ncbi.nlm.nih.gov/pubmed/33650568
http://dx.doi.org/10.1107/S1600577520016264

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