Effect of load sequence interaction on bond-wire lifetime due to power cycling

Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ([Formula: see text] ) and the heating duration ([Formula: see text] ) are investigate...

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Detalles Bibliográficos
Autores principales: Khatir, Zoubir, Tran, Son-Ha, Ibrahim, Ali, Lallemand, Richard, Degrenne, Nicolas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7946878/
https://www.ncbi.nlm.nih.gov/pubmed/33692407
http://dx.doi.org/10.1038/s41598-021-84976-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7946878/
https://www.ncbi.nlm.nih.gov/pubmed/33692407
http://dx.doi.org/10.1038/s41598-021-84976-2

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