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Investigating the Trackability of Silicon Microprobes in High-Speed Surface Measurements
High-speed tactile roughness measurements set high demand on the trackability of the stylus probe. Because of the features of low mass, low probing force, and high signal linearity, the piezoresistive silicon microprobe is a hopeful candidate for high-speed roughness measurements. This paper investi...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7956422/ https://www.ncbi.nlm.nih.gov/pubmed/33668104 http://dx.doi.org/10.3390/s21051557 |