Addressing multiple bit/symbol errors in DRAM subsystem

As DRAM technology continues to evolve towards smaller feature sizes and increased densities, faults in DRAM subsystem are becoming more severe. Current servers mostly use CHIPKILL based schemes to tolerate up-to one/two symbol errors per DRAM beat. Such schemes may not detect multiple symbol errors...

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Detalles Bibliográficos
Autores principales: Yeleswarapu, Ravikiran, Somani, Arun K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: PeerJ Inc. 2021
Materias:
Algorithms and Analysis of Algorithms
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7959593/
https://www.ncbi.nlm.nih.gov/pubmed/33817009
http://dx.doi.org/10.7717/peerj-cs.359

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7959593/
https://www.ncbi.nlm.nih.gov/pubmed/33817009
http://dx.doi.org/10.7717/peerj-cs.359

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