In Situ TEM of Electrochemical Incidents: Effects of Biasing and Electron Beam on Electrochemistry

[Image: see text] In situ TEM utilizing specialized holders and MEMS chips allows the investigation of the interaction, evolution, property, and function of nanostructures and devices responding to designed environments and/or stimuli. This mini-review summarizes the recent progress of in situ TEM w...

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Detalles Bibliográficos
Autores principales: Han, Chaoya, Islam, Md Tariqul, Ni, Chaoying
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7970484/
https://www.ncbi.nlm.nih.gov/pubmed/33748565
http://dx.doi.org/10.1021/acsomega.0c05829

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7970484/
https://www.ncbi.nlm.nih.gov/pubmed/33748565
http://dx.doi.org/10.1021/acsomega.0c05829

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