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In Situ TEM of Electrochemical Incidents: Effects of Biasing and Electron Beam on Electrochemistry
[Image: see text] In situ TEM utilizing specialized holders and MEMS chips allows the investigation of the interaction, evolution, property, and function of nanostructures and devices responding to designed environments and/or stimuli. This mini-review summarizes the recent progress of in situ TEM w...
Autores principales: | Han, Chaoya, Islam, Md Tariqul, Ni, Chaoying |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2021
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7970484/ https://www.ncbi.nlm.nih.gov/pubmed/33748565 http://dx.doi.org/10.1021/acsomega.0c05829 |
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