Genome-wide association study reveals the genetic basis of yield- and quality-related traits in wheat

BACKGROUND: Identifying the loci and dissecting the genetic architecture underlying wheat yield- and quality-related traits are essential for wheat breeding. A genome-wide association study was conducted using a high-density 90 K SNP array to analyze the yield- and quality-related traits of 543 brea...

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Detalles Bibliográficos
Autores principales: Gao, Le, Meng, Chengsheng, Yi, Tengfei, Xu, Ke, Cao, Huiwen, Zhang, Shuhua, Yang, Xueju, Zhao, Yong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2021
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7980635/
https://www.ncbi.nlm.nih.gov/pubmed/33740889
http://dx.doi.org/10.1186/s12870-021-02925-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7980635/
https://www.ncbi.nlm.nih.gov/pubmed/33740889
http://dx.doi.org/10.1186/s12870-021-02925-7

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