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Low-Resistance Room-Temperature Interconnection Technique for Bonding Fine Pitch Bumps

In this work, we demonstrate on a new interconnection technology which can be used for bonding Flip-Chips with 5-µm-Bumps and fine pitches <5 µm. In this technology, the bumps on both joint partners are coated with metallic nanowires (in most cases copper, in rare cases gold), through an in situ...

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Detalles Bibliográficos
Autores principales: Roustaie, F., Quednau, S., Weißenborn, F., Birlem, O.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7985230/
https://www.ncbi.nlm.nih.gov/pubmed/33776387
http://dx.doi.org/10.1007/s11665-021-05649-9