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Impact of device scaling on the electrical properties of MoS(2) field-effect transistors
Two-dimensional semiconducting materials are considered as ideal candidates for ultimate device scaling. However, a systematic study on the performance and variability impact of scaling the different device dimensions is still lacking. Here we investigate the scaling behavior across 1300 devices fab...
Autores principales: | Arutchelvan, Goutham, Smets, Quentin, Verreck, Devin, Ahmed, Zubair, Gaur, Abhinav, Sutar, Surajit, Jussot, Julien, Groven, Benjamin, Heyns, Marc, Lin, Dennis, Asselberghs, Inge, Radu, Iuliana |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7987965/ https://www.ncbi.nlm.nih.gov/pubmed/33758215 http://dx.doi.org/10.1038/s41598-021-85968-y |
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