FPGA-Based Acceleration on Additive Manufacturing Defects Inspection

Additive manufacturing (AM) has gained increasing attention over the past years due to its fast prototype, easier modification, and possibility for complex internal texture devices when compared to traditional manufacture processing. However, potential internal defects are occurring during AM proces...

Descripción completa

Detalles Bibliográficos
Autores principales: Luo, Yawen, Chen, Yuhua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8003074/
https://www.ncbi.nlm.nih.gov/pubmed/33803530
http://dx.doi.org/10.3390/s21062123

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8003074/
https://www.ncbi.nlm.nih.gov/pubmed/33803530
http://dx.doi.org/10.3390/s21062123

Ejemplares similares