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FPGA-Based Acceleration on Additive Manufacturing Defects Inspection
Additive manufacturing (AM) has gained increasing attention over the past years due to its fast prototype, easier modification, and possibility for complex internal texture devices when compared to traditional manufacture processing. However, potential internal defects are occurring during AM proces...
Autores principales: | Luo, Yawen, Chen, Yuhua |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8003074/ https://www.ncbi.nlm.nih.gov/pubmed/33803530 http://dx.doi.org/10.3390/s21062123 |
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