Spatial Location in Integrated Circuits through Infrared Microscopy †

In this paper, we present an infrared microscopy based approach for structures’ location in integrated circuits, to automate their secure characterization. The use of an infrared sensor is the key device for internal integrated circuit inspection. Two main issues are addressed. The first concerns th...

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Detalles Bibliográficos
Autores principales: Abelé, Raphaël, Damoiseaux, Jean-Luc, Moubtahij, Redouane El, Boi, Jean-Marc, Fronte, Daniele, Liardet, Pierre-Yvan, Merad, Djamal
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8003807/
https://www.ncbi.nlm.nih.gov/pubmed/33804619
http://dx.doi.org/10.3390/s21062175

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8003807/
https://www.ncbi.nlm.nih.gov/pubmed/33804619
http://dx.doi.org/10.3390/s21062175

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