High-fidelity structured illumination microscopy by point-spread-function engineering

Structured illumination microscopy (SIM) has become a widely used tool for insight into biomedical challenges due to its rapid, long-term, and super-resolution (SR) imaging. However, artifacts that often appear in SIM images have long brought into question its fidelity, and might cause misinterpreta...

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Detalles Bibliográficos
Autores principales: Wen, Gang, Li, Simin, Wang, Linbo, Chen, Xiaohu, Sun, Zhenglong, Liang, Yong, Jin, Xin, Xing, Yifan, Jiu, Yaming, Tang, Yuguo, Li, Hui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8016956/
https://www.ncbi.nlm.nih.gov/pubmed/33795640
http://dx.doi.org/10.1038/s41377-021-00513-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8016956/
https://www.ncbi.nlm.nih.gov/pubmed/33795640
http://dx.doi.org/10.1038/s41377-021-00513-w

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