Raw and processed data used in the simultaneous analysis of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain

Here is presented raw and analysed data collected during study of the evolution, with uniaxial stretching, of the electrical and microcrystalline characteristics of polystyrene sulfonate doped poly(3,4-ethylenedioxythiophene) (PEDOT:PSS) organic electrochemical transistors (OECTs). X-ray diffraction...

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Detalles Bibliográficos
Autores principales: Troughton, J.G., Marchiori, B., Delattre, R., Escoubas, S., Aliouat, MY., Grigorian, S., Ramuz, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2021
Materias:
Data Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8027693/
https://www.ncbi.nlm.nih.gov/pubmed/33855131
http://dx.doi.org/10.1016/j.dib.2021.106946

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8027693/
https://www.ncbi.nlm.nih.gov/pubmed/33855131
http://dx.doi.org/10.1016/j.dib.2021.106946

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