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Time-of-flight secondary ion mass spectrometry fragment regularity in gallium-doped zinc oxide thin films
Time-of-flight secondary ion mass spectrometry fragment analysis remains a challenging task. The fragment appearance regularity (FAR) rule is particularly useful for two-element compounds such as ZnO. Ion fragments appearing in the form of Zn(x)O(y) obey the rule [Formula: see text] in the positive...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8027856/ https://www.ncbi.nlm.nih.gov/pubmed/33828210 http://dx.doi.org/10.1038/s41598-021-87386-6 |