Facile Method for Morphological Characterization at Nano Scale

BACKGROUND: Dynamic light scattering (DLS) and electron microscopy (EM) are the most practical techniques for nanoparticles (NPs) characterization. However, the impediments which involved the sample preparation method lead to failure in provided results of mentioned device analysis. These problems w...

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Detalles Bibliográficos
Autores principales: Dinari, Ali, Mortazavi Farsani, Seyedeh Sahar, Mohammadi, Soheila, Najafi, Farhood, Abdollahi, Mahdi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: National Institute of Genetic Engineering and Biotechnology 2020
Materias:
Brief Report
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8035413/
https://www.ncbi.nlm.nih.gov/pubmed/33850948
http://dx.doi.org/10.30498/IJB.2020.2645

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8035413/
https://www.ncbi.nlm.nih.gov/pubmed/33850948
http://dx.doi.org/10.30498/IJB.2020.2645

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