Modelling Electron Channeling Contrast Intensity of Stacking Fault and Twin Boundary Using Crystal Thickness Effect

In a scanning electron microscope, the backscattered electron intensity modulations are at the origin of the contrast of like-Kikuchi bands and crystalline defects. The Electron Channeling Contrast Imaging (ECCI) technique is suited for defects characterization at a mesoscale with transmission elect...

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Detalles Bibliográficos
Autores principales: Kriaa, Hana, Guitton, Antoine, Maloufi, Nabila
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8036259/
https://www.ncbi.nlm.nih.gov/pubmed/33808289
http://dx.doi.org/10.3390/ma14071696

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8036259/
https://www.ncbi.nlm.nih.gov/pubmed/33808289
http://dx.doi.org/10.3390/ma14071696

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