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Bayesian Particle Instance Segmentation for Electron Microscopy Image Quantification
[Image: see text] Automating the analysis portion of materials characterization by electron microscopy (EM) has the potential to accelerate the process of scientific discovery. To this end, we present a Bayesian deep-learning model for semantic segmentation and localization of particle instances in...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical
Society
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041280/ https://www.ncbi.nlm.nih.gov/pubmed/33682402 http://dx.doi.org/10.1021/acs.jcim.0c01455 |