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Bayesian Particle Instance Segmentation for Electron Microscopy Image Quantification

[Image: see text] Automating the analysis portion of materials characterization by electron microscopy (EM) has the potential to accelerate the process of scientific discovery. To this end, we present a Bayesian deep-learning model for semantic segmentation and localization of particle instances in...

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Detalles Bibliográficos
Autores principales:	Yildirim, Batuhan, Cole, Jacqueline M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2021
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041280/ https://www.ncbi.nlm.nih.gov/pubmed/33682402 http://dx.doi.org/10.1021/acs.jcim.0c01455

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