Application of DBN and GWO-SVM in analog circuit fault diagnosis

For large-scale integrated electronic equipment, the complex operating mechanisms make fault detection very difficult. Therefore, it is important to accurately identify analog circuit faults in a timely manner. To overcome this problem, this paper proposes a novel fault diagnosis method based on the...

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Detalles Bibliográficos
Autores principales: Su, Xiyuan, Cao, Changqing, Zeng, Xiaodong, Feng, Zhejun, Shen, Jingshi, Yan, Xu, Wu, Zengyan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041839/
https://www.ncbi.nlm.nih.gov/pubmed/33846418
http://dx.doi.org/10.1038/s41598-021-86916-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041839/
https://www.ncbi.nlm.nih.gov/pubmed/33846418
http://dx.doi.org/10.1038/s41598-021-86916-6

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