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Application of DBN and GWO-SVM in analog circuit fault diagnosis
For large-scale integrated electronic equipment, the complex operating mechanisms make fault detection very difficult. Therefore, it is important to accurately identify analog circuit faults in a timely manner. To overcome this problem, this paper proposes a novel fault diagnosis method based on the...
Autores principales: | Su, Xiyuan, Cao, Changqing, Zeng, Xiaodong, Feng, Zhejun, Shen, Jingshi, Yan, Xu, Wu, Zengyan |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041839/ https://www.ncbi.nlm.nih.gov/pubmed/33846418 http://dx.doi.org/10.1038/s41598-021-86916-6 |
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