A robust nitridation technique for fabrication of disordered superconducting TiN thin films featuring phase slip events

Disorder induced phase slip (PS) events appearing in the current voltage characteristics (IVCs) are reported for two-dimensional TiN thin films produced by a robust substrate mediated nitridation technique. Here, high temperature annealing of Ti/Si(3)N(4) based metal/substrate assembly is the key to...

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Detalles Bibliográficos
Autores principales: Yadav, Sachin, Kaushik, Vinay, Saravanan, M. P., Aloysius, R. P., Ganesan, V., Sahoo, Sangeeta
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8042045/
https://www.ncbi.nlm.nih.gov/pubmed/33846407
http://dx.doi.org/10.1038/s41598-021-86819-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8042045/
https://www.ncbi.nlm.nih.gov/pubmed/33846407
http://dx.doi.org/10.1038/s41598-021-86819-6

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