Length-scale-dependent stress relief mechanisms in indium at high homologous temperatures

Nanoindentation and electron microscopy have been used to examine the length-scale-dependent stress relaxation mechanisms in well-annealed, high-purity indium at a homologous temperature of 0.69. The experimental methods, analysis, and observations serve as a stepping stone in identifying the stress...

Descripción completa

Detalles Bibliográficos
Autores principales: Mallakpour, Fereshteh, Kasraie, Masoud, Herbert, Erik G., Phani, P. Sudharshan, Hackney, Stephen A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2021
Materias:
Invited Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8045576/
https://www.ncbi.nlm.nih.gov/pubmed/33875904
http://dx.doi.org/10.1557/s43578-021-00186-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8045576/
https://www.ncbi.nlm.nih.gov/pubmed/33875904
http://dx.doi.org/10.1557/s43578-021-00186-6

Ejemplares similares