Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc: Thin‐Film Transistor and Sensor Behavior of ZnO Films and Rods

Zinc oxide thin films are fabricated by controlled oxidation of sputtered zinc metal films on a hotplate in air at temperatures between 250 and 450 °C. The nanocrystalline films possess high relative densities and show preferential growth in (100) orientation. Integration in thin‐film transistors re...

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Detalles Bibliográficos
Autores principales: Hoffmann, Rudolf C., Sanctis, Shawn, Liedke, Maciej O., Butterling, Maik, Wagner, Andreas, Njel, Christian, Schneider, Jörg J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2021
Materias:
Full Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8048417/
https://www.ncbi.nlm.nih.gov/pubmed/33241921
http://dx.doi.org/10.1002/chem.202004270

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8048417/
https://www.ncbi.nlm.nih.gov/pubmed/33241921
http://dx.doi.org/10.1002/chem.202004270

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