Revealing molecular conformation–induced stress at embedded interfaces of organic optoelectronic devices by sum frequency generation spectroscopy

Interface stresses are pervasive and critical in conventional optoelectronic devices and generally lead to many failures and reliability problems. However, detection of the interface stress embedded in organic optoelectronic devices is a long-standing problem, which causes the unknown relationship b...

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Detalles Bibliográficos
Autores principales: Wang, Zhongwu, Lin, Hongzhen, Zhang, Xi, Li, Jie, Chen, Xiaosong, Wang, Shuguang, Gong, Wenbin, Yan, Hui, Zhao, Qiang, Lv, Weibang, Gong, Xue, Xiao, Qingbo, Li, Fujin, Ji, Deyang, Zhang, Xiaotao, Dong, Huanli, Li, Liqiang, Hu, Wenping
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Association for the Advancement of Science 2021
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8050595/
https://www.ncbi.nlm.nih.gov/pubmed/33853785
http://dx.doi.org/10.1126/sciadv.abf8555

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8050595/
https://www.ncbi.nlm.nih.gov/pubmed/33853785
http://dx.doi.org/10.1126/sciadv.abf8555

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