Mitigating background caused by extraneous scattering in small-angle neutron scattering instrument design

Measurements, calculations and design ideas to mitigate background caused by extraneous scattering in small-angle neutron scattering (SANS) instruments are presented. Scattering includes processes such as incoherent scattering, inelastic scattering and Bragg diffraction. Three primary sources of thi...

Descripción completa

Detalles Bibliográficos
Autores principales: Barker, John George, Cook, Jeremy C., Chabot, Jean Philippe, Kline, Steven R., Zhang, Zhenhuan, Gagnon, Cedric
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8056761/
https://www.ncbi.nlm.nih.gov/pubmed/33953652
http://dx.doi.org/10.1107/S1600576721001084

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8056761/
https://www.ncbi.nlm.nih.gov/pubmed/33953652
http://dx.doi.org/10.1107/S1600576721001084

Ejemplares similares