Defect Induced Polarization Loss in Multi‐Shelled Spinel Hollow Spheres for Electromagnetic Wave Absorption Application

Defect engineering is an effective approach to manipulate electromagnetic (EM) parameters and enhance absorption ability, but defect induced dielectric loss dominant mechanism has not been completely clarified. Here the defect induced dielectric loss dominant mechanism in virtue of multi‐shelled spi...

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Detalles Bibliográficos
Autores principales: Qin, Ming, Zhang, Limin, Zhao, Xiaoru, Wu, Hongjing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2021
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8061380/
https://www.ncbi.nlm.nih.gov/pubmed/33898201
http://dx.doi.org/10.1002/advs.202004640

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8061380/
https://www.ncbi.nlm.nih.gov/pubmed/33898201
http://dx.doi.org/10.1002/advs.202004640

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