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Defect Induced Polarization Loss in Multi‐Shelled Spinel Hollow Spheres for Electromagnetic Wave Absorption Application
Defect engineering is an effective approach to manipulate electromagnetic (EM) parameters and enhance absorption ability, but defect induced dielectric loss dominant mechanism has not been completely clarified. Here the defect induced dielectric loss dominant mechanism in virtue of multi‐shelled spi...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
John Wiley and Sons Inc.
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8061380/ https://www.ncbi.nlm.nih.gov/pubmed/33898201 http://dx.doi.org/10.1002/advs.202004640 |