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A New Approach for the Control and Reduction of Warpage and Residual Stresses in Bonded Wafer
A geometrical modification on silicon wafers before the bonding process, aimed to decrease (1) the residual stress caused by glass frit bonding, is proposed. Finite element modeling showed that (2) by introducing this modification, the wafer out-of-plane deflection was decreased by 34%. Moreover, (3...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8066177/ https://www.ncbi.nlm.nih.gov/pubmed/33810581 http://dx.doi.org/10.3390/mi12040361 |