Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography

This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel...

Descripción completa

Detalles Bibliográficos
Autores principales: Moskovchenko, Alexey I., Švantner, Michal, Vavilov, Vladimir P., Chulkov, Arsenii O.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8069946/
https://www.ncbi.nlm.nih.gov/pubmed/33920169
http://dx.doi.org/10.3390/ma14081886

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8069946/
https://www.ncbi.nlm.nih.gov/pubmed/33920169
http://dx.doi.org/10.3390/ma14081886

Ejemplares similares