Motionless Polarizing Structured Illumination Microscopy

In this investigation, we propose a motionless polarizing structured illumination microscopy as an axially sectioning and reflective-type device to measure the 3D surface profiles of specimens. Based on the spatial phase-shifting technique to obtain the visibility of the illumination pattern. Instea...

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Detalles Bibliográficos
Autores principales: Park, Hyo Mi, Joo, Ki-Nam
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8073734/
https://www.ncbi.nlm.nih.gov/pubmed/33920615
http://dx.doi.org/10.3390/s21082837

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8073734/
https://www.ncbi.nlm.nih.gov/pubmed/33920615
http://dx.doi.org/10.3390/s21082837

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