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Spatial Mesh-Based Surface Source Model for the Electron Contamination of an 18 MV Photon Beams
BACKGROUND: Source modeling is an approach to reduce computational burden in Monte Carlo simulations but at the cost of reduced accuracy. Although this method can be effective, one component of the source model that is exceptionally difficult to model is the electron contamination, a significant con...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Wolters Kluwer - Medknow
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8074718/ https://www.ncbi.nlm.nih.gov/pubmed/33953497 http://dx.doi.org/10.4103/jmp.JMP_29_20 |