Synchrotron total-scattering data applicable to dual-space structural analysis

Synchrotron powder X-ray diffraction (PXRD) is a well established technique for investigating the atomic arrangement of crystalline materials. At modern beamlines, X-ray scattering data can be collected in a total-scattering setting, which additionally opens up the opportunity for direct-space struc...

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Detalles Bibliográficos
Autores principales: Beyer, Jonas, Kato, Kenichi, Brummerstedt Iversen, Bo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8086158/
https://www.ncbi.nlm.nih.gov/pubmed/33953925
http://dx.doi.org/10.1107/S2052252521001664

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8086158/
https://www.ncbi.nlm.nih.gov/pubmed/33953925
http://dx.doi.org/10.1107/S2052252521001664

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