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Synchrotron total-scattering data applicable to dual-space structural analysis

Synchrotron powder X-ray diffraction (PXRD) is a well established technique for investigating the atomic arrangement of crystalline materials. At modern beamlines, X-ray scattering data can be collected in a total-scattering setting, which additionally opens up the opportunity for direct-space struc...

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Detalles Bibliográficos
Autores principales:	Beyer, Jonas, Kato, Kenichi, Brummerstedt Iversen, Bo
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2021
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8086158/ https://www.ncbi.nlm.nih.gov/pubmed/33953925 http://dx.doi.org/10.1107/S2052252521001664

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