Optimized cryo-EM data-acquisition workflow by sample-thickness determination

Sample thickness is a known key parameter in cryo-electron microscopy (cryo-EM) and can affect the amount of high-resolution information retained in the image. Yet, common data-acquisition approaches in single-particle cryo-EM do not take it into account. Here, it is demonstrated how the sample thic...

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Detalles Bibliográficos
Autores principales: Rheinberger, Jan, Oostergetel, Gert, Resch, Guenter P., Paulino, Cristina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Ccp-EM
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8098475/
https://www.ncbi.nlm.nih.gov/pubmed/33950013
http://dx.doi.org/10.1107/S205979832100334X

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8098475/
https://www.ncbi.nlm.nih.gov/pubmed/33950013
http://dx.doi.org/10.1107/S205979832100334X

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