Dissection of Genetic Basis Underpinning Kernel Weight-Related Traits in Common Wheat

Genetic dissection kernel weight-related traits is of great significance for improving wheat yield potential. As one of the three major yield components of wheat, thousand kernel weight (TKW) was mainly affected by grain length (GL) and grain width (GW). To uncover the key loci for these traits, we...

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Detalles Bibliográficos
Autores principales: Li, Shunda, Wang, Liang, Meng, Yaning, Hao, Yuanfeng, Xu, Hongxin, Hao, Min, Lan, Suque, Zhang, Yingjun, Lv, Liangjie, Zhang, Kai, Peng, Xiaohui, Lan, Caixia, Li, Xingpu, Zhang, Yelun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8103506/
https://www.ncbi.nlm.nih.gov/pubmed/33916985
http://dx.doi.org/10.3390/plants10040713

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8103506/
https://www.ncbi.nlm.nih.gov/pubmed/33916985
http://dx.doi.org/10.3390/plants10040713

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