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Multi-level characteristics of TiO(x) transparent non-volatile resistive switching device by embedding SiO(2) nanoparticles

TiO(x)-based resistive switching devices have recently attracted attention as a promising candidate for next-generation non-volatile memory devices. A number of studies have attempted to increase the structural density of resistive switching devices. The fabrication of a multi-level switching device...

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Detalles Bibliográficos
Autores principales: Kwon, Sera, Kim, Min-Jung, Chung, Kwun-Bum
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8110581/
https://www.ncbi.nlm.nih.gov/pubmed/33972612
http://dx.doi.org/10.1038/s41598-021-89315-z