Fabrication of Small-Pixel CdZnTe Sensors and Characterization with X-rays

Over the past few years, sensors made from high-Z compound semiconductors have attracted quite some attention for use in applications which require the direct detection of X-rays in the energy range 30–100 keV. One of the candidate materials with promising properties is cadmium zinc telluride (CdZnT...

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Detalles Bibliográficos
Autores principales: Tsigaridas, Stergios, Zanettini, Silvia, Bettelli, Manuele, Amadè, Nicola Sarzi, Calestani, Davide, Ponchut, Cyril, Zappettini, Andrea
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8122653/
https://www.ncbi.nlm.nih.gov/pubmed/33922055
http://dx.doi.org/10.3390/s21092932

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8122653/
https://www.ncbi.nlm.nih.gov/pubmed/33922055
http://dx.doi.org/10.3390/s21092932

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