Screening of important metabolites and KRAS genotypes in colon cancer using secondary ion mass spectrometry

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) is an imaging‐based analytical technique that can characterize the surfaces of biomaterials. We used TOF‐SIMS to identify important metabolites and oncogenic KRAS mutation expressed in human colorectal cancer (CRC). We obtained 540 TOF‐SIMS s...

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Detalles Bibliográficos
Autores principales: Cho, Kookrae, Choi, Eun‐Sook, Lee, Sung Young, Kim, Jung‐Hee, Moon, Dae Won, Son, Jong‐Wuk, Kim, Eunjoo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley & Sons, Inc. 2020
Materias:
Research Reports
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8126813/
https://www.ncbi.nlm.nih.gov/pubmed/34027089
http://dx.doi.org/10.1002/btm2.10200

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8126813/
https://www.ncbi.nlm.nih.gov/pubmed/34027089
http://dx.doi.org/10.1002/btm2.10200

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