Observation of Electric-Field-Induced Structural Dislocations in a Ferroelectric Oxide

[Image: see text] Dislocations are 1D topological defects with emergent electronic properties. Their low dimensionality and unique properties make them excellent candidates for innovative device concepts, ranging from dislocation-based neuromorphic memory to light emission from diodes. To date, disl...

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Detalles Bibliográficos
Autores principales: Evans, Donald M., Småbråten, Didrik René, Holstad, Theodor S., Vullum, Per Erik, Mosberg, Aleksander B., Yan, Zewu, Bourret, Edith, van Helvoort, Antonius T. J., Selbach, Sverre M., Meier, Dennis
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8155316/
https://www.ncbi.nlm.nih.gov/pubmed/33861614
http://dx.doi.org/10.1021/acs.nanolett.0c04816

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8155316/
https://www.ncbi.nlm.nih.gov/pubmed/33861614
http://dx.doi.org/10.1021/acs.nanolett.0c04816

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