THz-TDS Reflection Measurement of Coating Thicknesses at Non-Perpendicular Incidence: Experiment and Simulation

Time-domain spectroscopy (TDS) in the terahertz (THz) frequency range is gaining in importance in nondestructive testing of dielectric materials. One application is the layer thickness measurement of a coating layer. To determine the thickness from the measurement data, the refractive index of the c...

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Detalles Bibliográficos
Autores principales: Burger, Ruben, Frisch, Julia, Hübner, Matthias, Goldammer, Matthias, Peters, Ole, Rönneberg, Enno, Wu, Datong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8156446/
https://www.ncbi.nlm.nih.gov/pubmed/34065760
http://dx.doi.org/10.3390/s21103473

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8156446/
https://www.ncbi.nlm.nih.gov/pubmed/34065760
http://dx.doi.org/10.3390/s21103473

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