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Cryo-EM Map–Based Model Validation Using the False Discovery Rate Approach

Significant technological developments and increasing scientific interest in cryogenic electron microscopy (cryo-EM) has resulted in a rapid increase in the amount of data generated by these experiments and the derived atomic models. Robust measures for the validation of 3D reconstructions and atomi...

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Detalles Bibliográficos
Autores principales: Olek, Mateusz, Joseph, Agnel Praveen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8167059/
https://www.ncbi.nlm.nih.gov/pubmed/34084774
http://dx.doi.org/10.3389/fmolb.2021.652530