TEM sample preparation using micro-manipulator for in-situ MEMS experiment

Growing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we suggeste...

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Detalles Bibliográficos
Autores principales: Lee, Hyunjong, Okello, Odongo Francis Ngome, Kim, Gi-Yeop, Song, Kyung, Choi, Si-Young
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Singapore 2021
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8190252/
https://www.ncbi.nlm.nih.gov/pubmed/34106374
http://dx.doi.org/10.1186/s42649-021-00057-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8190252/
https://www.ncbi.nlm.nih.gov/pubmed/34106374
http://dx.doi.org/10.1186/s42649-021-00057-8

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