Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics

The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction fo...

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Detalles Bibliográficos
Autores principales: Kokosza, Łukasz, Pawlak, Jakub, Mitura, Zbigniew, Przybylski, Marek
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8199926/
https://www.ncbi.nlm.nih.gov/pubmed/34205158
http://dx.doi.org/10.3390/ma14113056

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8199926/
https://www.ncbi.nlm.nih.gov/pubmed/34205158
http://dx.doi.org/10.3390/ma14113056

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