Local stiffness and work function variations of hexagonal boron nitride on Cu(111)

Combined scanning tunnelling and atomic force microscopy using a qPlus sensor enables the measurement of electronic and mechanic properties of two-dimensional materials at the nanoscale. In this work, we study hexagonal boron nitride (h-BN), an atomically thin 2D layer, that is van der Waals-coupled...

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Detalles Bibliográficos
Autores principales: Grewal, Abhishek, Wang, Yuqi, Münks, Matthias, Kern, Klaus, Ternes, Markus
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2021
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8218540/
https://www.ncbi.nlm.nih.gov/pubmed/34221802
http://dx.doi.org/10.3762/bjnano.12.46

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8218540/
https://www.ncbi.nlm.nih.gov/pubmed/34221802
http://dx.doi.org/10.3762/bjnano.12.46

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