High-precision targeting workflow for volume electron microscopy

Cells are 3D objects. Therefore, volume EM (vEM) is often crucial for correct interpretation of ultrastructural data. Today, scanning EM (SEM) methods such as focused ion beam (FIB)–SEM are frequently used for vEM analyses. While they allow automated data acquisition, precise targeting of volumes of...

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Detalles Bibliográficos
Autores principales: Ronchi, Paolo, Mizzon, Giulia, Machado, Pedro, D’Imprima, Edoardo, Best, Benedikt T., Cassella, Lucia, Schnorrenberg, Sebastian, Montero, Marta G., Jechlinger, Martin, Ephrussi, Anne, Leptin, Maria, Mahamid, Julia, Schwab, Yannick
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Rockefeller University Press 2021
Materias:
Tools
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8225610/
https://www.ncbi.nlm.nih.gov/pubmed/34160561
http://dx.doi.org/10.1083/jcb.202104069

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8225610/
https://www.ncbi.nlm.nih.gov/pubmed/34160561
http://dx.doi.org/10.1083/jcb.202104069

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