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Utilization of a Wheat50K SNP Microarray-Derived High-Density Genetic Map for QTL Mapping of Plant Height and Grain Traits in Wheat

Plant height is significantly correlated with grain traits, which is a component of wheat yield. The purpose of this study is to investigate the main quantitative trait loci (QTLs) that control plant height and grain-related traits in multiple environments. In this study, we constructed a high-densi...

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Detalles Bibliográficos
Autores principales: Lv, Dongyun, Zhang, Chuanliang, Yv, Rui, Yao, Jianxin, Wu, Jianhui, Song, Xiaopeng, Jian, Juntao, Song, Pengbo, Zhang, Zeyuan, Han, Dejun, Sun, Daojie
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8229693/
https://www.ncbi.nlm.nih.gov/pubmed/34201388
http://dx.doi.org/10.3390/plants10061167