Preliminary Validation of a Continuum Model for Dimple Patterns on Polyethylene Naphthalate via Ar Ion Beam Sputtering

This work reports the self-organization of dimple nanostructures on a polyethylene naphthalate (PEN) surface where an Ar ion beam was irradiated at an ion energy of 600 eV. The peak-to-peak roughness and diameter of dimple nanostructures were 29.1~53.4 nm and 63.4~77.6 nm, respectively. The electron...

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Detalles Bibliográficos
Autores principales: Yang, Jun-Yeong, Jung, Sunghoon, Byeon, Eun-Yeon, Lee, Hyun Hwi, Kim, Do-Geun, Kim, Hyo Jung, Jang, Ho Won, Lee, Seunghun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8230451/
https://www.ncbi.nlm.nih.gov/pubmed/34200831
http://dx.doi.org/10.3390/polym13121932

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8230451/
https://www.ncbi.nlm.nih.gov/pubmed/34200831
http://dx.doi.org/10.3390/polym13121932

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