Effect of Au-Coating on the Laser Spot Cutting on Spring Contact Probe (SCP) for Semi-Conductor Inspection

Spring contact probes (SCPs) are used to make contact with various test points on printed circuit boards (PCBs), wire harnesses, and connectors. Moreover, they can consist of the test interface between the PCBs and the semiconductor devices. For mass production of SCPs, ultra-small precision compone...

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Detalles Bibliográficos
Autores principales: Seo, Youngjin, Nam, Jungsoo, Yun, Huitaek, Jun, Martin Byung Guk, Lee, Dongkyoung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8232112/
https://www.ncbi.nlm.nih.gov/pubmed/34203677
http://dx.doi.org/10.3390/ma14123300

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8232112/
https://www.ncbi.nlm.nih.gov/pubmed/34203677
http://dx.doi.org/10.3390/ma14123300

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